X-ray Optics Section (XOS) is a part of Indus Synchrotron Utilization Division at RRACT and is working on research and development activities connected with x-ray optics. The group is involved with the fabrication and characterization of x-ray multilayer optics. It has made major contributions towards understanding the interface physics of these devices. For these activities various deposition and characterization techniques have been setup. XOS has built a vacuum ultra violet/soft x-ray reflectivity beamline (300eV to 10 eV) on Indus-1synchrotron. A x-ray reflectivity, grazing incidence diffraction and x-ray standing wave setups are also developed on sealed off x-ray tube for regular and speedy characterization of nano layered structures. Transmission electron microscope is available in the group to undertake cross sectional imaging of multilayer structures. The group is setting up x-ray lithography beamline which is under advance stage of construction for making high aspect ratio micro structures. A soft x-ray beamline on Indus-2 and x-ray optics metrology facilities are being setup.