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Beamlines Activity -> Technology Development
  • Ionisation chambers

Ionisation chambers (IC) are commonly used in hard X-ray beam lines to measure intensity of X-ray beam. ICs are gas (in this case argon) filled detectors, which can be used for various purposes in a beamline. They are kept just before the experimental station to monitor the incident intensity (I0) of x-ray beam. They can also be kept immediately after a double crystal monochromater (DCM) to align for DCM crystals and used in detuning the second crystal to suppress higher order harmonics. A large area IC has been designed fabricated and tested on 3kW, CuKa  x-ray source.

  • Fluorescent Screen (FS)
Removable FS along with a CCD camera is used at several places in a beamline for visual feedback of X-ray beam. Vacuum compatible material Red cd 106™ has been deposited on a flat glass substrate. The fluorescence has been checked on a 3 kW X-ray generator and the signal has been picked up on a CCD camera. The stepper motor surface driver interface has been developed for removing the FS from the beam path, once optical alignment of the beam is over.
  • Aperture System
Apertures are used to define the photon beam and the acceptance of the beamline, precisely.  Uncontrolled beam can damage the optical element, because of high heat load. The blades of aperature define the beam in horizontal and vertical planes.Such an aperture with four blades system, two horizontal and two vertical, which makes maximum aperture size 80mmx30mm has been developed.
  • Synchrotron Optics  cleaning system
Synchrotron optical elements are operated in high / ultra high vacuum environment.  Even in this environment, carbon contamination is practically unavoidable in the presence of intense x-ray synchrotron beam.  Carbon contamination decreases the efficiency of the optical elements (mirrors, gratings etc.). Various methods are used to clean the contaminated optics Cleaning of carbon contamination by oxygen plasma produced by RF source gives  the most efficient cleaning.  An RF plasma cleaning system has been developed  and has been tested to clean a glass substrates coated by carbon soot as well as by vacuum evaporation of carbon. The carbon contamination can be removed without any appreciable degradation of the reflectivity.
  • Development of D.C. Sputtering system

   

Figure 16 : D.C.Sputtering Setup                                        Figure 17 : Sputter coated cavity


            A d. c. sputtering system is developed for deposition of thin film of titanium inside ceramic cavities (105x50x400mm) of Indus-2 kicker magnet. Number of glass plates are coated  with this system to optimize the parameters. Thickness measurement is done by a surface profiler. Average thickness of 2 micron is observed. The adhesion of film is very good. Any type of tube, cavity or chamber can be coated from inside with any conducting film by this system. Other metallic films like niobium, chromium and nickel are also coated by this system.

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